NGD Analysis of Defected Ground and SIW-Matched Structure

A bandpass negative group delay (NGD) passive circuit based on defect ground structure (DGS) and substrate integrated waveguide (SIW)-matched is developed in the paper. The NGD DGS topology originally built with notched cells associated self-matched elements. design method introduced as a function of geometrical SIW via Then, parametric analyses full wave 3-D electromagnetic $S$ -parameter simulations were considered to investigate influence physical size effects. feasibility study validated fully distributed microstrip prototype. Significant performances measurements −1.69 ns value around 2 GHz center frequency over 33.7 MHz bandwidth. Insertion loss 4.37 dB, reflection reaches 41.5 dB.